Invention Application
US20170003315A1 MEMS SENSOR DEVICES HAVING A SELF-TEST MODE 审中-公开
具有自检模式的MEMS传感器器件

MEMS SENSOR DEVICES HAVING A SELF-TEST MODE
Abstract:
A micro-electro-mechanical system (MEMS) device comprises a micro-electro-mechanical system (MEMS) sensor; a detector circuit; a controller circuit coupled with the MEMS sensor; a first connection arranged between a first output of the MEMS sensor and a first input of the detector circuit; a second connection arranged between a second output of the MEMS sensor and a second input of the detector circuit; and a first switch arranged in the first connection. The controller circuit is configured to open the first switch during a first test mode so as to connect only a single input of the detector circuit with an output of the MEMS sensor. A further switch may be provided to connect two outputs of the MEMS sensor to a single input of the detector circuit.
Information query
Patent Agency Ranking
0/0