Invention Application
- Patent Title: APPARATUS AND METHOD OF MEASURING SIX DEGREES OF FREEDOM
- Patent Title (中): 测量自由度的六种方法的装置和方法
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Application No.: US15194914Application Date: 2016-06-28
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Publication No.: US20170003372A1Publication Date: 2017-01-05
- Inventor: Mathieu Antoina , Lawrence B. Brown , Jonathan R. Day , Matthew Frederick Evans , Ricardo Martins , Jacob J. Mertz , John Mountney , Robert Mark Neal , James Schloss , Quintin Stotts , Ding Wang , Robert E. Bridges
- Applicant: FARO Technologies, Inc.
- Main IPC: G01S3/786
- IPC: G01S3/786 ; G01B11/00
Abstract:
A dimensional measuring device sends a beam of light to a remote probe having a retroreflector and a pitch/yaw sensor. The pitch/yaw sensor passes the light through an aperture and a lens to a position sensor that generates an electrical signal indicative of the position of the received light. A processor uses the electrical signal to determine a pitch angle and a yaw angle of the remote probe.
Public/Granted literature
- US09903934B2 Apparatus and method of measuring six degrees of freedom Public/Granted day:2018-02-27
Information query
