Invention Application
- Patent Title: OBJECT ANALYZING METHOD AND OBJECT ANALYZING SYSTEM
- Patent Title (中): 对象分析方法和对象分析系统
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Application No.: US15196054Application Date: 2016-06-29
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Publication No.: US20170004380A1Publication Date: 2017-01-05
- Inventor: Chun-Chia Chen , Liang-Che Sun
- Applicant: MEDIATEK INC.
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/00

Abstract:
An object analyzing method applied to an object analyzing system. The object analyzing method comprises: (a) applying at least one analyzing parameter extracting process according to an object type for an target object, to extract at least one analyzing parameter for the target object; (b) selecting least one analyzing model according to the object type; and (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result.
Public/Granted literature
- US10275868B2 Object analyzing method and object analyzing system Public/Granted day:2019-04-30
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