Invention Application
US20170004380A1 OBJECT ANALYZING METHOD AND OBJECT ANALYZING SYSTEM 审中-公开
对象分析方法和对象分析系统

  • Patent Title: OBJECT ANALYZING METHOD AND OBJECT ANALYZING SYSTEM
  • Patent Title (中): 对象分析方法和对象分析系统
  • Application No.: US15196054
    Application Date: 2016-06-29
  • Publication No.: US20170004380A1
    Publication Date: 2017-01-05
  • Inventor: Chun-Chia ChenLiang-Che Sun
  • Applicant: MEDIATEK INC.
  • Main IPC: G06K9/62
  • IPC: G06K9/62 G06T7/00
OBJECT ANALYZING METHOD AND OBJECT ANALYZING SYSTEM
Abstract:
An object analyzing method applied to an object analyzing system. The object analyzing method comprises: (a) applying at least one analyzing parameter extracting process according to an object type for an target object, to extract at least one analyzing parameter for the target object; (b) selecting least one analyzing model according to the object type; and (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result.
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