Invention Application
US20170011917A1 ATOMIC LAYER EPITAXY FOR SEMICONDUCTOR GATE STACK LAYER FOR ADVANCED CHANNEL DEVICES
审中-公开
用于高级通道器件的半导体栅极堆叠层的原子层外观
- Patent Title: ATOMIC LAYER EPITAXY FOR SEMICONDUCTOR GATE STACK LAYER FOR ADVANCED CHANNEL DEVICES
- Patent Title (中): 用于高级通道器件的半导体栅极堆叠层的原子层外观
-
Application No.: US15275664Application Date: 2016-09-26
-
Publication No.: US20170011917A1Publication Date: 2017-01-12
- Inventor: Swaminathan T. SRINIVASAN , Aaron Muir HUNTER , Matthias BAUER , Amikam SADE
- Applicant: Applied Materials, Inc.
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/46 ; C23C16/455 ; C23C16/48 ; H01L21/687 ; C23C16/44

Abstract:
Embodiments of the present disclosure provide methods and apparatus for forming an epitaxial layer on a substrate. The substrate is exposed to pulsed laser radiation to clean, anneal, and/or activate the surface of the substrate. The substrate is then exposed to a deposition precursor in a self-limiting deposition process. The substrate may again be exposed to pulsed laser radiation, and then exposed to a second deposition precursor in a second self-limiting deposition process. The process may be repeated as desired to form an epitaxial layer of very high quality one atomic layer at a time.
Information query
IPC分类: