Invention Application
US20170016780A1 THERMAL ANALYSIS METHOD, THERMAL ANALYSIS DEVICE, AND RECORDING MEDIUM STORING THERMAL ANALYSIS PROGRAM
审中-公开
热分析方法,热分析装置和记录中温储存热分析程序
- Patent Title: THERMAL ANALYSIS METHOD, THERMAL ANALYSIS DEVICE, AND RECORDING MEDIUM STORING THERMAL ANALYSIS PROGRAM
- Patent Title (中): 热分析方法,热分析装置和记录中温储存热分析程序
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Application No.: US15170989Application Date: 2016-06-02
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Publication No.: US20170016780A1Publication Date: 2017-01-19
- Inventor: Hiroki Kobayashi , Masayoshi Hashima
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki-shi
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki-shi
- Priority: JP2015-142004 20150716
- Main IPC: G01K13/00
- IPC: G01K13/00

Abstract:
A thermal analysis method includes: setting, by a processor, a first node to a first component and second nodes to a second component from among components of an electronic device, based on design information of the electronic device; assigning thermal information including a second temperature and a second heat quantity to each of the second nodes, based on a first temperature and a first heat quantity of each of areas of the second component; calculating a first thermal resistance between adjacent nodes included in the second nodes, based on the thermal information; calculating a second thermal resistance between the first node and each of the second nodes, based on the design information to generate a thermal network including the first node, the second nodes, the first thermal resistance, and the second thermal resistance; and performing thermal analysis using the thermal network.
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