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Invention Application
US20170017840A1 DISPLAY CONDITION ANALYSIS DEVICE, DISPLAY CONDITION ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM 审中-公开
显示条件分析装置，显示条件分析方法和程序记录介质

  • Patent Title: DISPLAY CONDITION ANALYSIS DEVICE, DISPLAY CONDITION ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM
  • Patent Title (中): 显示条件分析装置，显示条件分析方法和程序记录介质
  • Application No.: US15124851
    Application Date: 2015-02-19
  • Publication No.: US20170017840A1
    Publication Date: 2017-01-19
  • Inventor: Kyota HIGA , Ruihan BAO , Takami SATO , Ryota MASE , Kota IWAMOTO
  • Applicant: NEC CORPORATION
  • Priority: JP2014-049001 20140312
  • International Application: PCT/JP2015/000775 WO 20150219
  • Main IPC: G06K9/00
  • IPC: G06K9/00 ;  G06Q10/08 ;  G06F17/30
DISPLAY CONDITION ANALYSIS DEVICE, DISPLAY CONDITION ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM
Abstract:
Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.
Abstract(Chinese):

公开了能够分析产品的显示条件的显示条件分析装置。 该显示条件分析装置设置有：产品识别装置，用于从显示器上拍摄的产品的显示图像识别显示图像中的产品; 以及显示条件分析装置，用于基于所识别的产品的位置来分析显示的产品的显示条件。

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