Invention Application
US20170023403A1 Spatial Light Measuring Method And Spatial Light Measuring System 有权
空间光测量方法和空间光测量系统

  • Patent Title: Spatial Light Measuring Method And Spatial Light Measuring System
  • Patent Title (中): 空间光测量方法和空间光测量系统
  • Application No.: US15207917
    Application Date: 2016-07-12
  • Publication No.: US20170023403A1
    Publication Date: 2017-01-26
  • Inventor: Hisashi IsozakiKazunori Sato
  • Applicant: TOPCON Corporation
  • Priority: JP2015-144010 20150721
  • Main IPC: G01J1/04
  • IPC: G01J1/04 G01J1/18
Spatial Light Measuring Method And Spatial Light Measuring System
Abstract:
The invention provides a spatial light measuring system, which comprises an illuminance measuring instrument for measuring an illuminance on the ground in a state where an illumination facility is new in a running direction of a traveling vehicle at predetermined intervals, the illuminance measuring instrument and an image pickup device which are mounted on the traveling vehicle for continuously acquiring images including an illumination facility at the predetermined time intervals, a speedmeter for detecting a speed of the traveling vehicle and an arithmetic device, wherein the arithmetic device is configured to store illuminance data acquired by the measurement in a new state as initial data, to make the traveling vehicle to run after acquiring the initial data, to save illuminance data acquired. by the illuminance measuring instrument as daily management data, and to specify an illuminance measuring position and an image acquiring position based on the speed of the traveling vehicle as detected by the speedmeter and the arithmetic device has a correction coefficient due to a distance from the ground to an illuminance measuring instrument mounting position and a correction coefficient due to the speed of the traveling vehicle and is configured to correct daily management data into illuminance data on the ground based on both the correction coefficients and to judge the soundness of the illumination facility based on a comparison between the illuminance data as corrected, the initial data and based on the images as acquired.
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