Invention Application
US20170030772A1 APPARATUS AND METHOD FOR VERIFYING REPEATABILITY OF SPECTROSCOPE, AND APPARATUS FOR ANALYZING SPECTRUM DATA
审中-公开
用于验证光谱可重复性的装置和方法以及分析光谱数据的装置
- Patent Title: APPARATUS AND METHOD FOR VERIFYING REPEATABILITY OF SPECTROSCOPE, AND APPARATUS FOR ANALYZING SPECTRUM DATA
- Patent Title (中): 用于验证光谱可重复性的装置和方法以及分析光谱数据的装置
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Application No.: US15215050Application Date: 2016-07-20
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Publication No.: US20170030772A1Publication Date: 2017-02-02
- Inventor: SO YOUNG LEE , SANG KYU KIM , KUN SUN EOM , JOON HYUNG LEE
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2015-0108288 20150730
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/28
Abstract:
An apparatus for verifying repeatability of a spectroscope may verify repeatability of spectrum data, measured by a spectroscope, based on repeatability verification criteria, and control the spectroscope whether or not to remeasure spectrum data.
Public/Granted literature
- US10746597B2 Apparatus and method for verifying repeatability of spectroscope, and apparatus for analyzing spectrum data Public/Granted day:2020-08-18
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