Invention Application
- Patent Title: SEMICONDUCTOR DEVICE COMPRISING A GRADUALLY INCREASING FIELD DIELECTRIC LAYER AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Patent Title (中): 包含增量场致电介质层的半导体器件及制造半导体器件的方法
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Application No.: US15216889Application Date: 2016-07-22
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Publication No.: US20170033191A1Publication Date: 2017-02-02
- Inventor: Andreas MEISER , Oliver HAEBERLEN
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Priority: DE102015112427.0 20150729
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L29/10 ; H01L29/66 ; H01L29/78

Abstract:
A semiconductor device is provided that includes a transistor in a semiconductor body having a main surface. The transistor includes a source region, a drain region, a body region, a drift zone, and a gate electrode at the body region. The body region and the drift zone are disposed along a first direction between the source region and the drain region. The first direction is parallel to the main surface. The semiconductor device further includes a field plate disposed in field plate trenches extending along the first direction in the drift zone, and a field dielectric layer between the field plate and the drift zone. A thickness of the field dielectric layer gradually increases along the first direction from a portion adjacent to the source region to a portion adjacent to the drain region.
Public/Granted literature
Information query
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