Invention Application
US20170052148A1 METHODS AND APPARATUS TO MEASURE AND ANALYZE VIBRATION SIGNATURES
审中-公开
测量和分析振动信号的方法和装置
- Patent Title: METHODS AND APPARATUS TO MEASURE AND ANALYZE VIBRATION SIGNATURES
- Patent Title (中): 测量和分析振动信号的方法和装置
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Application No.: US14941189Application Date: 2015-11-13
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Publication No.: US20170052148A1Publication Date: 2017-02-23
- Inventor: Leonardo William Estevez , Yuming Zhu , Sujeet Milind Patole
- Applicant: Texas Instruments Incorporated
- Main IPC: G01N29/12
- IPC: G01N29/12 ; G01N29/07

Abstract:
Methods and apparatus to measure and analyze vibration signatures are disclosed. In some examples, a meter is provided comprising a waveform generator to generate a waveform based on first distance measurements of an object. In some examples, the meter includes a waveform generator to determine a first vibration characteristic of the object based on the waveform. In some examples, the meter includes a comparator to compare the first vibration characteristic to a signature vibration characteristic of the object, the signature vibration characteristic of the object indicative of normal characteristics of the object. In some examples, the meter includes a reporter to, in response to determining the first vibration characteristic does not match the signature vibration characteristic, generate an alert.
Public/Granted literature
- US10416306B2 Methods and apparatus to measure and analyze vibration signatures Public/Granted day:2019-09-17
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