- Patent Title: Methods and apparatus to measure and analyze vibration signatures
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Application No.: US14941189Application Date: 2015-11-13
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Publication No.: US10416306B2Publication Date: 2019-09-17
- Inventor: Leonardo William Estevez , Yuming Zhu , Sujeet Milind Patole
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Brian D. Graham; Charles A. Brill; Frank D. Cimino
- Main IPC: G01N29/07
- IPC: G01N29/07 ; G01N29/12 ; G01N29/11 ; G01N29/14 ; G01S15/10 ; G01S7/539 ; G01S15/58 ; G01S15/00

Abstract:
Methods and apparatus to measure and analyze vibration signatures are disclosed. In some examples, a meter is provided comprising a waveform generator to generate a waveform based on first distance measurements of an object. In some examples, the meter includes a waveform generator to determine a first vibration characteristic of the object based on the waveform. In some examples, the meter includes a comparator to compare the first vibration characteristic to a signature vibration characteristic of the object, the signature vibration characteristic of the object indicative of normal characteristics of the object. In some examples, the meter includes a reporter to, in response to determining the first vibration characteristic does not match the signature vibration characteristic, generate an alert.
Public/Granted literature
- US20170052148A1 METHODS AND APPARATUS TO MEASURE AND ANALYZE VIBRATION SIGNATURES Public/Granted day:2017-02-23
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