Invention Application
- Patent Title: FORMING A GATE CONTACT IN THE ACTIVE AREA
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Application No.: US15244067Application Date: 2016-08-23
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Publication No.: US20170054004A1Publication Date: 2017-02-23
- Inventor: Kangguo Cheng , Ruilong Xie , Tenko Yamashita
- Applicant: International Business Machines Corporation , GlobalFoundries, Inc.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/768 ; H01L21/28 ; H01L21/02

Abstract:
A method of making a semiconductor device includes patterning a fin in a substrate; forming a gate between source/drain regions over the substrate, the gate having a dielectric spacer along a sidewall; removing a portion of the dielectric spacer and filling with a metal oxide to form a spacer having a first spacer portion and a second spacer portion; forming a source/drain contact over at least one of the source/drain regions; recessing the source/drain contact and forming a via contact over the source/drain contact; and forming a gate contact over the gate, the gate contact having a first gate contact portion contacting the gate and a second gate contact portion positioned over the first gate contact portion; wherein the first spacer portion isolates the first gate contact portion from the source/drain contact, and the second spacer portion isolates the second gate contact portion from the source/drain contact.
Public/Granted literature
- US10170583B2 Forming a gate contact in the active area Public/Granted day:2019-01-01
Information query
IPC分类: