Invention Application
US20170075691A1 INSTRUCTION FOR ELEMENT OFFSET CALCULATION IN A MULTI-DIMENSIONAL ARRAY
审中-公开
元素偏差计算在多维阵列中的指导
- Patent Title: INSTRUCTION FOR ELEMENT OFFSET CALCULATION IN A MULTI-DIMENSIONAL ARRAY
- Patent Title (中): 元素偏差计算在多维阵列中的指导
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Application No.: US15363785Application Date: 2016-11-29
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Publication No.: US20170075691A1Publication Date: 2017-03-16
- Inventor: MIKHAIL PLOTNIKOV , ANDREY NARAIKIN , ELMOUSTAPHA OULD-AHMED-VALL
- Applicant: Intel Corporation
- Main IPC: G06F9/355
- IPC: G06F9/355 ; G06F9/38 ; G06F9/30

Abstract:
An apparatus is described having functional unit logic circuitry. The functional unit logic circuitry has a first register to store a first input vector operand having an element for each dimension of a multi-dimensional data structure. Each element of the first vector operand specifying the size of its respective dimension. The functional unit has a second register to store a second input vector operand specifying coordinates of a particular segment of the multi-dimensional structure. The functional unit also has logic circuitry to calculate an address offset for the particular segment relative to an address of an origin segment of the multi-dimensional structure.
Public/Granted literature
- US10025591B2 Instruction for element offset calculation in a multi-dimensional array Public/Granted day:2018-07-17
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