- 专利标题: High-Temperature Test Fixture
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申请号: US15327501申请日: 2014-07-25
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公开(公告)号: US20170160336A1公开(公告)日: 2017-06-08
- 发明人: Xiaoniu Tu , Yanqing Zheng , Haikuan Kong , Erwei Shi
- 申请人: R&D CENTER, SHANGHAI INSTITUTE OF CERAMICS , SHANGHAI INSTITUTE OF CERAMICS, CHINESE ACADEMY OF SCIENCES
- 优先权: CN201410352594.2 20140723
- 国际申请: PCT/CN2014/083039 WO 20140725
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R19/22 ; G01R27/02 ; G01R1/04
摘要:
A high temperature fixture, said fixture comprising: at least three noble metal electrodes, arranged in parallel, among which two adjacent noble metal electrodes are used for clamping a test sample; noble metal wires connected to the noble metal electrodes at one end, and to a test device at the other end for transmitting test signals generated by the test sample to the test device through the noble metal electrodes; and a thermocouple for measuring the temperature of the test materials.
公开/授权文献
- US10215798B2 High-temperature test fixture 公开/授权日:2019-02-26