Invention Application
- Patent Title: Calibrating in Single Photon Emission Computed Tomography with Multi-Emission Energies
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Application No.: US15315151Application Date: 2015-06-12
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Publication No.: US20170192104A1Publication Date: 2017-07-06
- Inventor: Manojeet Bhattacharya
- Applicant: Siemens Medical Solutions USA, Inc.
- International Application: PCT/IB2015/054449 WO 20150612
- Main IPC: G01T1/164
- IPC: G01T1/164 ; G01T1/166 ; G01T1/24 ; A61B6/00 ; G01T7/00 ; G01T1/208 ; G01T1/40 ; G12B13/00 ; G01T1/29
Abstract:
For calibration (24) for quantitative SPECT, a multiple energy emission source (11) is used for calibration. The planar sensitivities and/or uniformities are determined at different emission energies based on detections from the multiple energy emission source. For estimating (32) the activity concentration, sensitivities and/or uniformities based on measures (26) at different emission energies increase accuracy. The multiple energy emission source (11) may alternatively or additionally be used to calibrate (40) a dose calibrator (15).
Public/Granted literature
- US09910162B2 Calibrating in single photon emission computed tomography with multi-emission energies Public/Granted day:2018-03-06
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