Invention Application
- Patent Title: SELF-ALIGNED GATE LAST III-N TRANSISTORS
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Application No.: US15326022Application Date: 2014-08-13
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Publication No.: US20170207310A1Publication Date: 2017-07-20
- Inventor: Han Wui Then , Sansaptak Dasgupta , Seung Hoon Sung , Sanaz Gardner , Marko Radosavljevic , Robert Chau
- Applicant: Intel Corporation
- International Application: PCT/US14/50826 WO 20140813
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L29/66 ; H01L29/778 ; H01L29/40 ; H01L29/20 ; H01L29/205

Abstract:
Techniques related to III-N transistors having self aligned gates, systems incorporating such transistors, and methods for forming them are discussed. Such transistors include a polarization layer between a raised source and a raised drain, a gate between the source and drain and over the polarization layer, and lateral epitaxial overgrowths over the source and drain and having and opening therebetween such that at least a portion of the gate adjacent to the polarization layer is aligned with the opening.
Public/Granted literature
- US09837499B2 Self-aligned gate last III-N transistors Public/Granted day:2017-12-05
Information query
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