发明申请
- 专利标题： NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY
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申请号： US15485003申请日： 2017-04-11
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公开(公告)号： US20170221691A1公开(公告)日： 2017-08-03
- 发明人: J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
- 申请人： Ionwerks, Inc.
- 申请人地址： US TX Houston
- 专利权人： Ionwerks, Inc.
- 当前专利权人： Ionwerks, Inc.
- 当前专利权人地址： US TX Houston
- 主分类号： H01J49/10
- IPC分类号： H01J49/10 ; G01N21/64 ; G01N21/65 ; H01J49/04
摘要：
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
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