- 专利标题: SELF-ALIGNED LOCAL INTERCONNECT TECHNOLOGY
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申请号: US15484309申请日: 2017-04-11
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公开(公告)号: US20170221808A1公开(公告)日: 2017-08-03
- 发明人: Andrew M. Greene , Injo Ok , Balasubramanian Pranatharthiharan , Charan V.V.S. Surisetty , Ruilong Xie
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION , GlobalFoundries, Inc.
- 主分类号: H01L23/528
- IPC分类号: H01L23/528 ; H01L21/306 ; H01L29/66 ; H01L21/768 ; H01L29/49 ; H01L29/78
摘要:
A self-aligned interconnect structure includes a fin structure patterned in a substrate; an epitaxial contact disposed over the fin structure; a first metal gate and a second metal gate disposed over and substantially perpendicular to the epitaxial contact, the first metal gate and the second metal gate being substantially parallel to one another; and a metal contact on and in contact with the substrate in a region between the first and second metal gates.
公开/授权文献
- US10236253B2 Self-aligned local interconnect technology 公开/授权日:2019-03-19
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