- 专利标题: ELECTRICAL INTERCONNECT STRUCTURE FOR AN EMBEDDED ELECTRONICS PACKAGE
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申请号: US15594794申请日: 2017-05-15
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公开(公告)号: US20170250093A1公开(公告)日: 2017-08-31
- 发明人: Paul Alan McConnelee , Arun Virupaksha Gowda
- 申请人: General Electric Company
- 主分类号: H01L21/56
- IPC分类号: H01L21/56 ; H01L23/538 ; H01L23/498 ; H01L21/48 ; H01L23/14 ; H01L23/31 ; H01L23/00
摘要:
An electronics package includes a lower insulating layer, an upper insulating layer coupled to the lower insulating layer, and a conductive contact pad coupled to a second surface of the upper insulating layer. An electrical component is positioned within an opening formed through the upper insulating layer. A first interconnect layer extends through at least one via in the lower insulating layer to electrically couple with at least one contact pad on the electrical component and a second interconnect layer extends through at least one via in the upper insulating layer and electrically couples the first interconnect layer to the conductive contact pad.
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