Invention Application
- Patent Title: METHOD AND DEVICE FOR MEASURING MURA LEVEL OF LIQUID CRYSTAL DISPLAY DEVICE
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Application No.: US15234001Application Date: 2016-08-11
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Publication No.: US20170261776A1Publication Date: 2017-09-14
- Inventor: Yisan ZHANG , Chun WANG , Junsheng CHEN , Yuanhui GUO , Yan WANG
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Anhui
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Anhui
- Priority: CN201610140930.6 20160311
- Main IPC: G02F1/13
- IPC: G02F1/13 ; G01J1/04 ; G01J1/16

Abstract:
The present disclosure provides a method and a device for measuring mura levels of liquid crystal display devices. The method includes steps of: acquiring correspondence between standard brightness data differences and standard mura levels; acquiring a measurement brightness data difference of a test image displayed by a to-be-tested liquid crystal display device before and after the measurement; and acquiring a mura level corresponding to the measurement brightness data difference in accordance with the correspondence.
Public/Granted literature
- US10114241B2 Method and device for measuring mura level of liquid crystal display device Public/Granted day:2018-10-30
Information query