- 专利标题: System Fault Diagnosis via Efficient Temporal and Dynamic Historical Fingerprint Retrieval
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申请号: US15490499申请日: 2017-04-18
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公开(公告)号: US20170308427A1公开(公告)日: 2017-10-26
- 发明人: Wei Cheng , Kenji Yoshihira , Haifeng Chen , Guofei Jiang
- 申请人: NEC Laboratories America, Inc.
- 主分类号: G06F11/07
- IPC分类号: G06F11/07
摘要:
Methods are provided for both single modal and multimodal fault diagnosis. In a method, a fault fingerprint is constructed based on a fault event using an invariant model. A similarity matrix between the fault fingerprint and one or more historical representative fingerprints are derived using dynamic time warping and at least one convolution. A feature vector in a feature subspace for the fault fingerprint is generated. The feature vector includes at least one status of at least one system component during the fault event. A corrective action correlated to the fault fingerprint is determined. The corrective action is initiated on a hardware device to mitigate expected harm to at least one item selected from the group consisting of the hardware device, another hardware device related to the hardware device, and a person related to the hardware device.
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