Invention Application
- Patent Title: METHOD AND APPARATUS FOR IMAGE ANALYSIS
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Application No.: US15533614Application Date: 2015-11-13
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Publication No.: US20170345138A1Publication Date: 2017-11-30
- Inventor: Scott Anderson MIDDLEBROOKS , Markus Gerardus Martinus Maria VAN KRAAIJ , Maxim PISARENCO , Adrianus Cornelis Matheus KOOPMAN , Stefan HUNSCHE , Willem Marie Julia Marcel COENE
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- International Application: PCT/EP2015/076582 WO 20151113
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
A method and apparatus of detection, registration and quantification of an image. The method may include obtaining an image of a lithographically created structure, and applying a level set method to an object, representing the structure, of the image to create a mathematical representation of the structure. The method may include obtaining a first dataset representative of a reference image object of a structure at a nominal condition of a parameter, and obtaining second dataset representative of a template image object of the structure at a non-nominal condition of the parameter. The method may further include obtaining a deformation field representative of changes between the first dataset and the second dataset. The deformation field may be generated by transforming the second dataset to project the template image object onto the reference image object. A dependence relationship between the deformation field and change in the parameter may be obtained.
Public/Granted literature
- US10607334B2 Method and apparatus for image analysis Public/Granted day:2020-03-31
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