A measurement apparatus comprising a base for receiving an object to be measured is disclosed. The base is provided with a pattern that is visually different in different locations. An abutment element is moveable relative to the object and the pattern, the moveable abutment element being configured to partially cover the pattern from an imaging apparatus and provide at least one datum point for the imaging apparatus for determining measurement data for the object based on the at least one datum point and a part of the pattern remaining visible for the imaging apparatus. Methods, imaging apparatuses and a system for generating and processing measurement data are also disclosed.