- 专利标题: Semiconductor Devices Having Fin Field Effect Transistor (FinFET) Structures and Manufacturing and Design Methods Thereof
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申请号: US15789488申请日: 2017-10-20
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公开(公告)号: US20180040618A1公开(公告)日: 2018-02-08
- 发明人: Tung Ying Lee , Wen-Huei Guo , Chih-Hao Chang , Shou-Zen Chang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 主分类号: H01L27/088
- IPC分类号: H01L27/088 ; H01L21/84 ; H01L21/8234 ; H01L27/06 ; H01L29/06 ; H01L29/66
摘要:
Semiconductor devices and manufacturing and design methods thereof are disclosed. In one embodiment, a semiconductor device includes an active FinFET disposed over a workpiece comprising a first semiconductive material, the active FinFET comprising a first fin. An electrically inactive FinFET structure is disposed over the workpiece proximate the active FinFET, the electrically inactive FinFET comprising a second fin. A second semiconductive material is disposed between the first fin and the second fin.
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