Invention Application
- Patent Title: Full Pad Coverage Boundary Scan
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Application No.: US15722975Application Date: 2017-10-02
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Publication No.: US20180045778A1Publication Date: 2018-02-15
- Inventor: Prakash Narayanan , Rajesh Mittal , Rajat Mehrotra
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/3185 ; G01R31/3177

Abstract:
An integrated circuit, comprising functional circuitry and testing circuitry. A first set of pads is operable in a first state for communicating testing signals to the testing circuitry and operable in a second state for communicating input/output signals to the functional circuitry. A second set of pads, differing from the first set of pads, is operable in the second state for communicating testing signals to the testing circuitry for testing signals associated in the second state with the first set of pads.
Public/Granted literature
- US10274538B2 Full pad coverage boundary scan Public/Granted day:2019-04-30
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