Invention Application
- Patent Title: THREE-DIMENSIONAL NONVOLATILE MEMORY AND RELATED READ METHOD DESIGNED TO REDUCE READ DISTURBANCE
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Application No.: US15790257Application Date: 2017-10-23
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Publication No.: US20180047448A1Publication Date: 2018-02-15
- Inventor: SANG-WAN NAM , WON-TAECK JUNG
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Priority: KR10-2013-0022313 20130228
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26 ; G11C16/34 ; G11C16/08 ; G11C16/10 ; G11C16/24

Abstract:
A nonvolatile memory device performs a read operation comprising first and second intervals. In the first interval the device applies a turn-on voltage to string selection lines and ground selection lines connected to the string selection transistors and the ground selection transistors, respectively. In the second interval, the device applies a turn-off voltage to unselected string selection lines and unselected ground selection lines while continuing to apply the turn-on voltage to a selected string selection line and a selected ground selection line. In both the first and second intervals, the device applies a first read voltage to a selected wordline connected to memory cells to be read by the read operation and applying a second read voltage to unselected wordlines among connected to memory cells not to be read by the read operation.
Public/Granted literature
- US10043580B2 Three-dimensional nonvolatile memory and related read method designed to reduce read disturbance Public/Granted day:2018-08-07
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