- 专利标题: Semiconductor Devices with Charge Fixing Layers
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申请号: US15466111申请日: 2017-03-22
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公开(公告)号: US20180053775A1公开(公告)日: 2018-02-22
- 发明人: Phil Ouk Nam , Hyung Joon Kim , Sung Gil Kim , Ji Hoon Choi , Seulye Kim , Hong Suk Kim , Jae Young Ahn
- 申请人: Phil Ouk Nam , Hyung Joon Kim , Sung Gil Kim , Ji Hoon Choi , Seulye Kim , Hong Suk Kim , Jae Young Ahn
- 优先权: KR10-2016-0106014 20160822
- 主分类号: H01L27/11556
- IPC分类号: H01L27/11556 ; H01L27/11582 ; H01L29/40 ; H01L29/06
摘要:
A semiconductor device may include gate electrodes and interlayer insulating layers alternately stacked on a substrate, a channel layer penetrating the gate electrodes and the interlayer insulating layers, a gate dielectric layer between the gate electrodes and the channel layer, a filling insulation that fills at least a portion of an interior of the channel layer, a charge fixing layer between the channel layer and the filling insulation and including a high-k material and/or a metal, and a conductive pad connected to the channel layer and on the filling insulation. The conductive pad may be physically separated from the charge fixing layer.
公开/授权文献
- US10002875B2 Semiconductor devices with charge fixing layers 公开/授权日:2018-06-19
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