Invention Application
- Patent Title: METHODS AND CIRCUITRY FOR ANALYZING VOLTAGES
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Application No.: US15245882Application Date: 2016-08-24
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Publication No.: US20180059151A1Publication Date: 2018-03-01
- Inventor: Olivier Trescases , Johan Tjeerd Strydom , Rajarshi Mukhopadhyay
- Applicant: Texas Instruments Incorporated
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G01R15/06 ; H03K17/687

Abstract:
Circuitry and methods for measuring the voltage at a node are disclosed. A capacitive divider is coupled to the node, wherein the capacitive divider provides a first output. A resistive divider is coupled to the node, wherein the resistive divider provides a second output.
Public/Granted literature
- US10024887B2 Methods and circuitry for analyzing voltages Public/Granted day:2018-07-17
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