- 专利标题: WAFER BOAT AND TREATMENT APPARATUS FOR WAFERS
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申请号: US15563662申请日: 2016-03-31
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公开(公告)号: US20180076071A1公开(公告)日: 2018-03-15
- 发明人: Michael Klick , Ralf Rothe , Wilfried Lerch , Johannes Rehli
- 申请人: Wilfried Lerch
- 优先权: DE102015004352.8 20150402
- 国际申请: PCT/EP2016/057173 WO 20160331
- 主分类号: H01L21/673
- IPC分类号: H01L21/673 ; H01J37/32 ; H01L21/67 ; H01L21/324 ; C23C16/458 ; C23C16/505 ; H01L21/677
摘要:
A wafer boat is described for the plasma treatment of disc-shaped wafers, in particular semiconductor wafers for semiconductor or photovoltaic applications, which has a plurality of plates positioned parallel to each other made of an electrically conductive material which have at least one carrier for a wafer on each side which faces another plate and define a receiving space for the wafers on the plates. The wafer boat also has a plurality of spacer elements, which are positioned between directly adjacent plates in order to position the plates parallel to each other, wherein the spacer elements are electrically conductive. Also a plasma treatment apparatus for wafers and a method for the plasma treatment of wafers is described. The apparatus has a process chamber for the reception of a wafer boat of the previously described type, means for controlling or regulating a process gas atmosphere in the process chamber and at least one voltage source, which is connectable to the plates of the wafer boat in a suitable manner, in order to apply an electrical voltage between directly adjacent plates of the wafer boat wherein the at least one voltage source is suitable for applying at least one DC-voltage or at least one low-frequency AC-voltage and at least one high-frequency AC-voltage. In the method, during the heating phase a DC-voltage or a low-frequency AC-voltage is applied to the plates of the wafer boat in such a way that the spacer elements heat up by current flowing therethrough, and during a processing phase a high-frequency AC-voltage is applied to the plates of the wafer boat, in order to generate a plasma between the wafers inserted into them.
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