- 专利标题: SUBSTRATE HOLDER, LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND METHOD OF MANUFACTURING A SUBSTRATE HOLDER
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申请号: US15823247申请日: 2017-11-27
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公开(公告)号: US20180081284A1公开(公告)日: 2018-03-22
- 发明人: Raymond Wilhelmus Louis LAFARRE , Nina Vladimirovna DZIOMKINA , Yogesh Paramod KARADE , Elisabeth Corinne RODENBURG , Peter VAN DELFT
- 申请人: Raymond Wilhelmus Louis LAFARRE , Nina Vladimirovna DZIOMKINA , Yogesh Paramod KARADE , Elisabeth Corinne RODENBURG , Peter VAN DELFT
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; B05D1/00
摘要:
A substrate holder for a lithographic apparatus has a planarization layer provided on a surface thereof. The planarization layer provides a smooth surface for the formation of a thin film stack forming an electronic component. The planarization layer is of substantially uniform thickness and/or its outer surface has a peak to valley distance of less than 10 μm. The planarization layer may be formed by applying two solutions of different concentration. A surface treatment may be applied to the burls to repel a solution of the planarization layer material.
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