Invention Application
- Patent Title: TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
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Application No.: US15712264Application Date: 2017-09-22
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Publication No.: US20180087968A1Publication Date: 2018-03-29
- Inventor: Hisashi ISOZAKI
- Applicant: Topcon Corporation
- Applicant Address: JP Tokyo
- Assignee: Topcon Corporation
- Current Assignee: Topcon Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2016-188480 20160927
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J5/52 ; A01K9/00 ; A01K29/00

Abstract:
The temperature measurement device includes a thermography 20 for measuring a temperature distribution of a predetermined range in a non-contact manner; a calibrator 21 including at least one heater 30 able to generate heat to a preset temperature; thermistors 32a to 32d provided on installation points on the calibrator 21, and measuring temperatures at the installation points, the installation points having different temperatures; and a controller 22 for calibrating a first temperature measurement result obtained from a temperature distribution of a range covering an object (an eye E of a calf C) measured by the thermography 20, based on temperature differences between a second temperature measurement result obtained from a temperature distribution of a range covering the calibrator 21 measured by the thermography 20 and a third temperature measurement result obtained from a temperature distribution of the calibrator 21 measured by the thermistors 32a to 32d.
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