- 专利标题: Clean Air Device and Dust Inspecting Method
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申请号: US15506274申请日: 2014-11-17
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公开(公告)号: US20180214861A1公开(公告)日: 2018-08-02
- 发明人: Keiichi ONO , Hirotoshi SATO
- 申请人: Hitachi Industrial Equipment Systems Co., Ltd.
- 国际申请: PCT/JP2014/080309 WO 20141117
- 主分类号: B01L1/04
- IPC分类号: B01L1/04 ; F24F3/16
摘要:
With respect to a clean air device, in order to provide a device structure and an air cleaning unit inspecting method capable of supplying clean air through a filter and also capable of measuring the amount of dust in a workroom space in which blown air forms a laminar flow such that an increase in the amount of dust can be accurately detected, the clean air device comprises an air cleaning unit, a rectifying unit arranged downstream of the air cleaning unit configured to rectify air blown from the air cleaning unit and form a laminar flow, and a workroom arranged downstream of the rectifying unit, wherein at least one suction port is provided on a wall surface in a space formed between the air cleaning unit and the rectifying unit, configured to draw out the air in the space to an exterior.
公开/授权文献
- US10525458B2 Clean air device and air cleaning unit inspecting method 公开/授权日:2020-01-07
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