- 专利标题： Charged Particle Radiation Measuring Method And Charged Particle Radiation Measuring Device
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申请号： US15756160申请日： 2016-08-25
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公开(公告)号： US20180244990A1公开(公告)日： 2018-08-30
- 发明人: Wataru Kada , Kenta Miura , Osamu Hanaizumi , Tomihiro Kamiya , Takahiro Satoh , Junichi Susaki , Suzuya Yamada
- 申请人： National University Corporation Gunma University , National Institutes for Quantum and Radiological Science And Technology , Denka Company Limited
- 优先权： JP2015-169363 20150828
- 国际申请： PCT/JP2016/074813 WO 20160825
- 主分类号： C09K11/64
- IPC分类号： C09K11/64 ; G01T1/202 ; C09K11/70
摘要：
[Problem] To provide highly heat-resistant and radiation-resistant radiation measuring equipment.[Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.
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