发明申请
- 专利标题: OPTIMIZATION OF SOURCE AND BANDWIDTH FOR NEW AND EXISTING PATTERNING DEVICES
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申请号: US15781970申请日: 2016-11-30
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公开(公告)号: US20180356734A1公开(公告)日: 2018-12-13
- 发明人: Willard Earl CONLEY , Wei-An HSIEH , Tsann-Bim CHIOU , Jason SHIEN
- 申请人: CYMER, LLC , ASML NETHERLANDS B.V.
- 申请人地址: US CA San Diego NL Veldhoven
- 专利权人: CYMER, LLC,ASML NETHERLANDS B.V.
- 当前专利权人: CYMER, LLC,ASML NETHERLANDS B.V.
- 当前专利权人地址: US CA San Diego NL Veldhoven
- 国际申请: PCT/EP2016/079190 WO 20161130
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03F1/36
摘要:
A method to improve a lithographic process of imaging a portion of a design layout onto a substrate using a lithographic apparatus, the method including: computing a multi-variable cost function, the multi-variable cost function being a function a plurality of design variables that represent characteristics of the lithographic process; and reconfiguring one or more of the characteristics of the lithographic process by adjusting one or more of the design variables until a certain termination condition is satisfied; wherein a bandwidth of a radiation source of the lithographic apparatus is allowed to change during the reconfiguration.
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