- 专利标题: FILM TEST STRUCTURE AND ARRAY SUBSTRATE
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申请号: US15573067申请日: 2017-05-05
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公开(公告)号: US20180358273A1公开(公告)日: 2018-12-13
- 发明人: Miao ZHANG , Jing SUN , Wuxia FU
- 申请人: BOE TECHNOLOGY GROUP CO., LTD. , HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO.,
- 申请人地址: CN Beijing CN Hefei, Anhui
- 专利权人: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人地址: CN Beijing CN Hefei, Anhui
- 优先权: CN201620956579.3 20160826
- 国际申请: PCT/CN2017/083195 WO 20170505
- 主分类号: H01L21/66
- IPC分类号: H01L21/66 ; H01L27/12 ; G01R31/28
摘要:
A film test structure and an array substrate are provided. The film test structure includes a conductive film to be tested; a plurality of test leads arranged at a different layer from the conductive film to be tested and electrically connected with the conductive film to be tested respectively; and a plurality of test terminals electrically connected with the plurality of test leads respectively.
公开/授权文献
- US10332811B2 Film test structure and array substrate 公开/授权日:2019-06-25
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