Invention Application
- Patent Title: APPARATUSES, DEVICES AND METHODS FOR SENSING A SNAPBACK EVENT IN A CIRCUIT
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Application No.: US16128241Application Date: 2018-09-11
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Publication No.: US20190013067A1Publication Date: 2019-01-10
- Inventor: Jeremy Miles Hirst , Hernan A. Castro , Stephen Tang
- Applicant: Micron Technology, Inc.
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C7/12 ; G11C7/06

Abstract:
Example subject matter disclosed herein relates to apparatuses and/or devices, and/or various methods for use therein, in which an application of an electric potential to a circuit may be initiated and subsequently changed in response to a determination that a snapback event has occurred in a circuit. For example, a circuit may comprise a memory cell that may experience a snapback event as a result of an applied electric potential. In certain example implementations, a sense circuit may be provided which is responsive to a snapback event occurring in a memory cell to generate a feed back signal to initiate a change in an electric potential applied to the memory cell.
Information query