Invention Application
- Patent Title: TESTING APPARATUS AND CONTROL METHOD THEREOF
-
Application No.: US16068615Application Date: 2016-11-03
-
Publication No.: US20190018031A1Publication Date: 2019-01-17
- Inventor: Jung Tae LEE , Jong Cheol KIM
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Priority: KR10-2016-0001478 20160106
- International Application: PCT/KR2016/012590 WO 20161103
- Main IPC: G01N35/00
- IPC: G01N35/00

Abstract:
A test apparatus and a control method thereof are provided. The test apparatus includes a storage configured to store information related to a battery provided in the test apparatus, a controller configured to calculate a power consumption rate of the battery changed according to an operation of the test apparatus based on the stored information of battery and configured to determine a current amount of power of the battery based on the calculated power consumption rate of the battery; and a display configured to display the current amount of power of the battery and at least one piece of information related to the operation of the test apparatus based on the determined current amount of power of the battery.
Information query