AUTOMATED MEASUREMENT BASED ON DEEP LEARNING
摘要:
A framework for automated measurement. In accordance with one aspect, the framework detects a centerline point of a structure of interest in an image. A centerline of the structure of interest may be traced based on the detected centerline point. A trained segmentation learning structure may be used to generate one or more contours of the structure of interest along the centerline. One or more measurements may then be extracted from the one or more contours.
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