- 专利标题: Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use
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申请号: US16136965申请日: 2018-09-20
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公开(公告)号: US20190019694A1公开(公告)日: 2019-01-17
- 发明人: Alan E. Humphrey , James H. Duvall , Jerry Broz
- 申请人: International Test Solutions, Inc.
- 申请人地址: US NV Reno
- 专利权人: International Test Solutions, Inc.
- 当前专利权人: International Test Solutions, Inc.
- 当前专利权人地址: US NV Reno
- 主分类号: H01L21/67
- IPC分类号: H01L21/67 ; G03F7/20 ; C23C16/02 ; B08B1/04 ; B24B37/34 ; B08B1/00
摘要:
A cleaning wafer or substrate for use in cleaning, or in combination with, components of, for example, integrated chip manufacturing apparatus. The cleaning substrate can include a substrate having varying predetermined surface features, such as one or more predetermined adhesive, non-tacky, electrostatic, projection, depression, or other physical sections. The predetermined features can provide for more effective cleaning of the components with which they are used, such as an integrated chip manufacturing apparatus in the place of the integrated chip wafer. The cleaning substrate can be urged into cleaning or other position by vacuum, mechanical, electrostatic, or other forces. The cleaning substrate can adapted to accomplish a variety of functions, including abrading or polishing. The cleaning substrate may be made by a novel method of making, and it may then be used in a novel method of use I combination with chip manufacturing apparatus.
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