Invention Application
- Patent Title: Forming Self-Aligned Contact with Spacer First
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Application No.: US15655547Application Date: 2017-07-20
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Publication No.: US20190027580A1Publication Date: 2019-01-24
- Inventor: Su Chen Fan , Andrew M. Greene , Sean Lian , Balasubramanian Pranatharthiharan , Mark V. Raymond , Ruilong Xie
- Applicant: International Business Machines Corporation , GLOBALFOUNDRIES Inc. , SAMSUNG ELECTRONICS CO., LTD.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/033 ; H01L21/768 ; H01L21/285

Abstract:
Techniques for forming self-aligned contacts by forming gate sidewall spacers and gates before forming the contacts are provided. In one aspect, a method of forming self-aligned contacts includes the steps of: forming multiple gate sidewall spacers on a substrate; burying the gate sidewall spacers in a dielectric; forming gate trenches by selectively removing the dielectric from regions between the gate sidewall spacers in which gates will be formed; forming the gates in the gate trenches; forming contact trenches by selectively removing the dielectric from regions between the gate sidewall spacers in which the self-aligned contacts will be formed; and forming the self-aligned contacts in the contact trenches. A device structure having self-aligned contacts is also provided.
Public/Granted literature
- US10186599B1 Forming self-aligned contact with spacer first Public/Granted day:2019-01-22
Information query
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