NEURAL ELECTRODE FOR MEASURING NEURAL SIGNAL AND METHOD FOR MANUFACTURING THE SAME

Invention Application

US20190076038A1 NEURAL ELECTRODE FOR MEASURING NEURAL SIGNAL AND METHOD FOR MANUFACTURING THE SAME 审中-公开

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Patent Title: NEURAL ELECTRODE FOR MEASURING NEURAL SIGNAL AND METHOD FOR MANUFACTURING THE SAME
Application No.: US16116810

Application Date: 2018-08-29
Publication No.: US20190076038A1

Publication Date: 2019-03-14
Inventor: Yong Hee KIM , Sang Don JUNG
Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Priority: KR10-2017-0118059 20170914
Main IPC: A61B5/04
IPC: A61B5/04 ; C25D7/06 ; C25D5/34 ; C25D9/04

NEURAL ELECTRODE FOR MEASURING NEURAL SIGNAL AND METHOD FOR MANUFACTURING THE SAME

Abstract:

Provided are a neural electrode for measuring a neural signal, and a method for manufacturing the same. The method for manufacturing the same includes forming an ITO electrode on a substrate, forming a passivation layer for exposing a portion of the ITO electrode, forming ITO nanowires on the ITO electrode, and forming a metal oxide on the ITO nanowires.

Public/Granted literature

US10582865B2 Neural electrode for measuring neural signal and method for manufacturing the same Public/Granted day:2020-03-10

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