- 专利标题: CT INSPECTION SYSTEM AND CT IMAGING METHOD
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申请号: US16234621申请日: 2018-12-28
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公开(公告)号: US20190204242A1公开(公告)日: 2019-07-04
- 发明人: Xiulin NI , Jianmin LI , Haitian TAN , Yulan LI , Weifeng YU , Yuanjing LI , Hejun ZHOU , Zhiqiang CHEN , Chunguang ZONG , Li ZHANG
- 申请人: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
- 优先权: CN201711451934.7 20171228
- 主分类号: G01N23/046
- IPC分类号: G01N23/046 ; G01V5/00
摘要:
The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.
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