- 专利标题: CT INSPECTION SYSTEM AND CT IMAGING METHOD
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申请号: US16234625申请日: 2018-12-28
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公开(公告)号: US20190204243A1公开(公告)日: 2019-07-04
- 发明人: Kejun KANG , Jianmin LI , Xiulin NI , Yulan LI , Yuanjing LI , Zhiqiang CHEN , Li ZHANG , Liang LI , Xiang ZOU , Weifeng YU , Hejun ZHOU , Chunguang ZONG
- 申请人: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
- 优先权: CN201711451912.0 20171228
- 主分类号: G01N23/046
- IPC分类号: G01N23/046
摘要:
The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device.
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