发明申请
- 专利标题: TAMPER EVIDENT BAG
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申请号: US15884664申请日: 2018-01-31
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公开(公告)号: US20190233191A1公开(公告)日: 2019-08-01
- 发明人: Sumei Lin , Li-yung Chang , Ben Tseng
- 申请人: Inteplast Group Corporation
- 主分类号: B65D77/30
- IPC分类号: B65D77/30 ; B65D33/08 ; B65D33/18 ; B65D33/01 ; B65D77/12
摘要:
A tamper evident bag has front and rear panels connected together along opposite first and second side edge margins and a bottom edge margins that define a bag interior and a first bag opening therebetween. The front and rear panels each have a tear line with a first end and a second end, the first and second ends being located at the first side edge margin. The first and second ends of each tear line being spaced part. The tear lines extend over the front and rear panels but remain spaced from the second side edge margin. Each tear line defines a respective tear out section on the front and rear panels. The tear out sections are joined along the first side edge margin and are configured to be removed to create a second bag opening.
公开/授权文献
- US10793335B2 Tamper evident bag 公开/授权日:2020-10-06
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