Invention Application
- Patent Title: PLASMA ETCHING REACTION CHAMBER
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Application No.: US15886844Application Date: 2018-02-02
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Publication No.: US20190244787A1Publication Date: 2019-08-08
- Inventor: Wei-Chuan Chou , Zhi Kai Huang , Mu-Chun Ho , Chun-Fu Wang , Yi-Hsiang Chen , Hsin-Chih Chiu , Yao-Syuan Cheng
- Applicant: Wei-Chuan Chou , Zhi Kai Huang , Mu-Chun Ho , Chun-Fu Wang , Yi-Hsiang Chen , Hsin-Chih Chiu , Yao-Syuan Cheng
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
A plasma etching reaction chamber includes a casing having a receiving chamber; a base liftably installed below the receiving chamber; a first electrode and a second electrode; and a radio frequency electrode rod. The second electrode has a plurality of water channels and a bottom of the second electrode is installed with two cooling water tubes which are communicated with the plurality of water channels; upper sides of the two cooling water tubes are hidden within the driving rod and lower sides thereof extend downwards to be out of the casing so that external cooling water can flow into the cooling water tubes and then to the water channels to achieve the object of cooling.
Information query