Invention Application
- Patent Title: ABNORMALITY DETECTION SYSTEM, SUPPORT DEVICE, AND ABNORMALITY DETECTION METHOD
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Application No.: US16275348Application Date: 2019-02-14
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Publication No.: US20190301979A1Publication Date: 2019-10-03
- Inventor: Shinsuke KAWANOUE , Kota MIYAMOTO
- Applicant: OMRON Corporation
- Applicant Address: JP KYOTO
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP KYOTO
- Priority: JP2018-068167 20180330
- Main IPC: G01M99/00
- IPC: G01M99/00

Abstract:
There is a need to flexibly set a determination reference suitable for application of predictive maintenance to an actual production site. A first abnormality detection unit includes a calculation unit that calculates a score using a feature quantity that is calculated from a state value related to a monitoring target according to an abnormality detection parameter, and a determination unit that performs a determination using the score calculated by the calculation unit and a first determination reference and a second determination reference included in the abnormality detection parameter, outputs a first determination result when the score matches the first determination reference, and outputs a second determination result when the score matches the second determination reference.
Information query