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公开(公告)号:US20190286096A1
公开(公告)日:2019-09-19
申请号:US16248793
申请日:2019-01-16
Applicant: OMRON Corporation
Inventor: Shinsuke KAWANOUE , Kota MIYAMOTO
IPC: G05B19/406 , G06N20/00
Abstract: An abnormality detection system, support device, and model generation method for generating a more highly accurate abnormality detection model before an actual operation are provided. A model generation part includes a section for generating feature values from state values provided from a state value storage part; a section for calculating importance levels respectively for the generated feature values based on plural methods, wherein the importance levels indicating a degree that is effective for abnormality detection; and a section for integrating the importance levels calculated based on the plural methods for each of the generated feature values and determining rankings of the importance levels of the generated feature values.
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公开(公告)号:US20190286085A1
公开(公告)日:2019-09-19
申请号:US16248787
申请日:2019-01-16
Applicant: OMRON Corporation
Inventor: Shinsuke KAWANOUE , Kota MIYAMOTO , Reiko HATTORI , Yuki HIROHASHI
Abstract: An abnormality detection system, support device, and model generation method are provided for generating a more highly accurate abnormality detection model before an actual operation. A model generation part of an abnormality detection system includes a section for generating plural feature values from state values provided from a state value storage part, a section for selecting a combination of one or plural feature values among the plural generated feature values, a section for generating an extra learning data set having at least part of a data series of the feature values of the selected combination and a data series of statistically generated virtual feature values, and a section for evaluating a detection accuracy of a model corresponding to the feature values of the selected combination using the extra learning data set.
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公开(公告)号:US20210397148A1
公开(公告)日:2021-12-23
申请号:US17270449
申请日:2020-02-20
Applicant: OMRON Corporation
Inventor: Yuya OTA , Reiko HATTORI , Kosuke TSURUTA , Akira NAKAJIMA , Shinsuke KAWANOUE
IPC: G05B19/042
Abstract: An analysis device according to one aspect of the present invention supplies a definition for a dependency relation between an input parameter and an output parameter of a standard function, which cannot be derived in a dependency analysis of a control program, the definition being supplied by use of function structure information which is external information. In other words, an analysis device according to this configuration identifies a dependency relation between an input parameter and an output parameter of the standard function on the basis of function structure information that defines a dependency relation between the input parameter and the output parameter of the standard function. Therefore, the dependency relation between the input and the output of a standard function becomes clear, so the dependency relations between a plurality of device variables that mediate the standard function can be identified.
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公开(公告)号:US20210200194A1
公开(公告)日:2021-07-01
申请号:US17269535
申请日:2020-02-03
Applicant: OMRON Corporation
Inventor: Toshifumi MINEMOTO , Reiko HATTORI , Yuya OTA , Shinsuke KAWANOUE , Akira NAKAJIMA
IPC: G05B19/418 , G05B23/02
Abstract: A display system provided in production equipment having driving means and monitoring means with controllable features includes a control unit, a display unit, and a storage unit. The control unit obtains a feature output over time from at least one among the driving means and the monitoring means, and causes the storage unit to store the feature; constructs, in each prescribed time, a causal relationship model that indicates a causal factor selected from among the driving means and the monitoring means for at least one abnormality that can occur in the production equipment and that also indicates the relationship between causal factors on the basis of the obtained feature; and displays, on the display unit, a plurality of causal relationship models constructed in a plurality of times.
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公开(公告)号:US20190278247A1
公开(公告)日:2019-09-12
申请号:US16219973
申请日:2018-12-14
Applicant: OMRON Corporation
Inventor: Yutaka ABE , Shinsuke KAWANOUE , Kota MIYAMOTO , Yuki UEYAMA
Abstract: A control system and a control method are provided. A control device in the control system includes a computation processing unit related to control of a control target, a collection unit that executes a process of collecting data associated with the control target, and a monitoring processing unit that executes a process of monitoring a state of the control target and includes a feature quantity generation unit that executes a process for generating a feature quantity from the collected data, and a detection unit that executes a for detecting an abnormality occurring in the control target using the generated feature quantity and an abnormality detection parameter suitable for detection of an abnormality occurring in the control target that is set based on a result of machine learning. An information processing device executes emulation of the monitoring process using the data associated with the control target from the control device.
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公开(公告)号:US20180164768A1
公开(公告)日:2018-06-14
申请号:US15784959
申请日:2017-10-16
Applicant: OMRON Corporation
Inventor: Shinsuke KAWANOUE
CPC classification number: G05B19/054 , G05B13/0265 , G05B19/0428 , G05B19/058 , G05B23/0237 , G05B23/0289 , G05B23/0294 , G05B2219/14014 , G05B2219/14037
Abstract: A control system includes a controller for controlling a control target and redundant devices accessible from the controller. The control system includes a feature quantity generation unit that generates a feature quantity from data associated with the redundant devices, an abnormality detection unit that determines whether an abnormality has occurred in one of the redundant devices based on the feature quantity generated by the feature quantity generation unit and a predetermined abnormality detection parameter, a switch unit that switches the redundant devices between a working mode and a standby mode when the abnormality detection unit determines that an abnormality has occurred, and a learning unit that performs machine learning using the data associated with the redundant devices to determine the abnormality detection parameter.
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公开(公告)号:US20170212699A1
公开(公告)日:2017-07-27
申请号:US15123204
申请日:2015-01-15
Applicant: OMRON Corporation
Inventor: Takehiko HIOKA , Yutaka ABE , Shinsuke KAWANOUE
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0659 , G06F3/0673 , G06F8/654 , G06F9/445 , G06F9/44505
Abstract: When user configuration data recorded in a recording medium is written into a PLC, the PLC determines, in accordance with a combination table stored in the recording medium, if a combination of the user configuration data and firmware already stored in the PLC is suitable. In addition, when firmware recorded in the recording medium is written into the PLC, the PLC determines, in accordance with the combination table stored in the recording medium, if a combination of the firmware and user configuration data already stored in the PLC is suitable.
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公开(公告)号:US20240386293A1
公开(公告)日:2024-11-21
申请号:US18564918
申请日:2022-03-17
Applicant: OMRON Corporation
Inventor: Yosuke NAGABAYASHI , Takashi FUJII , Shinsuke KAWANOUE
IPC: G06N5/022
Abstract: A prediction system including a Central Processing Unit (CPU) and a memory storing a program. The CPU executes a control operation for controlling a control target, generates a prediction model based on a tree learning algorithm, acquires a predicted value by inputting, to the prediction model, a process value including one or more state values among state values that can be referenced by the CPU, acquires each of first and second execution times that are times taken for outputting the predicted value in response to input of first and second data to the prediction model, calculates a maximum execution time of the prediction model based on the first and second execution times, and evaluates the prediction model based on the maximum execution time.
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公开(公告)号:US20240160202A1
公开(公告)日:2024-05-16
申请号:US18493094
申请日:2023-10-24
Applicant: OMRON Corporation
Inventor: Katsuyuki KIMURA , Shinsuke KAWANOUE
CPC classification number: G05B23/0275 , G05B13/041
Abstract: An information processing device is provided that includes an obtaining unit configured to obtain status data of a plurality of mechanisms in a processing step carried out in a production line, an abnormality detector configured to detect an abnormality based on the status data obtained by the obtaining unit, a surrogate model calculator configured to calculate a surrogate model based on the status data at time of detecting the abnormality, and an estimator configured to estimate an abnormality causal factor based on the surrogate model calculated earlier.
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公开(公告)号:US20180348728A1
公开(公告)日:2018-12-06
申请号:US15986103
申请日:2018-05-22
Applicant: OMRON Corporation
Inventor: Yuya OTA , Kosuke TSURUTA , Shinsuke KAWANOUE , Gaku SHIRAMIZU , Yasuaki ABE , Akira NAKAJIMA , Reiko HATTORI , Toshifumi MINEMOTO , Yuki HIROHASHI
IPC: G05B19/05 , G05B19/418 , G06F17/15 , G06F17/18
CPC classification number: G05B23/0275 , G05B19/41885 , G05B2219/31472
Abstract: A process analysis apparatus according to an aspect may include a first acquisition unit that acquires a plurality of pieces of state data related to states of a plurality of mechanisms that constitute a manufacturing line, a second acquisition unit that acquires a control program for controlling an operation of the manufacturing line, a first analyzer that analyzes the acquired plurality of pieces of state data so as to identify a connection state between the plurality of mechanisms, a second analyzer that analyzes the acquired control program so as to identify an order relationship between the plurality of mechanisms, and a relationship identifying unit that identifies a causal relationship between the plurality of mechanisms in a process that is carried out on the manufacturing line, based on the identified connection state and order relationship.
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