Invention Application
- Patent Title: CHAMBER CLEANING PROCESS
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Application No.: US16035431Application Date: 2018-07-13
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Publication No.: US20200020512A1Publication Date: 2020-01-16
- Inventor: Weiting CHEN , Lynn YANG , Christy PAN , Beom Soo PARK , Young-Jin CHOI , Max CHANG
- Applicant: Applied Materials, Inc.
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23C16/44 ; C23C16/50 ; B08B7/00

Abstract:
A method and apparatus for obtaining at least one normalized baseline spectrum for a processing volume of a processing chamber; calculating a distribution value of the normalized baseline spectrum; obtaining a plurality of normalized cleaning process spectrums; calculating a distribution function of the plurality of normalized cleaning process spectrums; comparing the distribution value to the distribution function; and determining an end point by identifying when the distribution function approaches the distribution value. A method includes: initiating a cleaning process in a processing chamber, flowing a cleaning gas into a processing volume of the processing chamber; obtaining a normalized baseline spectrum; measuring a plurality of intensity spectrums; calculate a plurality of normalized cleaning process spectrums; comparing a distribution value of the normalized baseline spectrum to a distribution function of the plurality of normalized cleaning process spectrums; and determining an end point by identifying when the distribution function approaches the distribution value.
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