发明申请
- 专利标题： Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
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申请号： US16530725申请日： 2019-08-02
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公开(公告)号： US20200041541A1公开(公告)日： 2020-02-06
- 发明人: Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
- 申请人： BRUKER NANO, INC.
- 主分类号： G01Q60/38
- IPC分类号： G01Q60/38 ; G01Q10/04 ; G01Q20/04 ; G01Q30/04
摘要：
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.