-
公开(公告)号：US11307220B2
公开(公告)日：2022-04-19
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
-
公开(公告)号：US20200041541A1
公开(公告)日：2020-02-06
申请号：US16530725
申请日：2019-08-02
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
-
公开(公告)号：US11635449B2
公开(公告)日：2023-04-25
申请号：US17722603
申请日：2022-04-18
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
-
4.发明申请CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY 有权使用正规化近场光谱的样品的化学纳米鉴定公开(公告)号：US20160018437A1
公开(公告)日：2016-01-21
申请号：US14773135
申请日：2014-03-14
发明人： Gregory Andreev , Sergey Osechinskiy , Stephen Minne , Chanmin Su
IPC分类号： G01Q60/18
摘要： Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and optionally, in the mid-infrared portion of the spectrum.
摘要翻译： 用于纳米识别样品的装置和方法通过使用ev逝波测量在样品和在样品之上的纳米距离处振荡的样品和光学纳米天线之间的近场相互作用的光谱，并且鉴别背景散射辐射对这种近似不敏感 场相互作用。 通过在纳秒天线振荡的周期性重复时刻的光学数据采集可以实现歧视，而不知道距离分离纳米天线和样品。 测量包括纳米尺度上的样品的化学鉴定，其中直接测量相应于表示所述相互作用的近场辐射的相位的绝对值，而没有偏移。 仪器和测量的校准通过在样品测量之前执行具有已知折射率的参考样品的参考测量来提供。 纳米识别实现了低于50nm的分辨率，并且可选地在光谱的中红外部分中实现。
-
公开(公告)号：US20220252638A1
公开(公告)日：2022-08-11
申请号：US17722603
申请日：2022-04-18
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
-
公开(公告)号：US20180364276A1
公开(公告)日：2018-12-20
申请号：US16055430
申请日：2018-08-06
申请人： BRUKER NANO, INC.
摘要： System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a tip of the near-field system. Demodulation of optical data representing such maps is carried out at different harmonics of probe-vibration frequency. Embodiments are operationally compatible with methodology of chemical nano-identification of sample utilizing normalized near-field spectroscopy, and may utilize suppression of background contribution to collected data based on judicious coordination of data acquisition with motion of the tip. Such coordination may be defined without knowledge of separation between the tip and sample. Computer program product with instructions effectuating the method and operation of the system.
-
公开(公告)号：US20210239732A1
公开(公告)日：2021-08-05
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
-
公开(公告)号：US10161960B1
公开(公告)日：2018-12-25
申请号：US16055430
申请日：2018-08-06
申请人： BRUKER NANO, INC.
摘要： System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a tip of the near-field system. Demodulation of optical data representing such maps is carried out at different harmonics of probe-vibration frequency. Embodiments are operationally compatible with methodology of chemical nano-identification of sample utilizing normalized near-field spectroscopy, and may utilize suppression of background contribution to collected data based on judicious coordination of data acquisition with motion of the tip. Such coordination may be defined without knowledge of separation between the tip and sample. Computer program product with instructions effectuating the method and operation of the system.
-
公开(公告)号：US09846178B2
公开(公告)日：2017-12-19
申请号：US15241029
申请日：2016-08-18
申请人： BRUKER NANO, INC.
发明人： Gregory Andreev , Sergey Osechinskiy , Stephen Minne , Chanmin Su
摘要： Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and, optionally, in the mid-infrared portion of the spectrum.
-
10.发明授权Chemical nano-identification of a sample using normalized near-field spectroscopy 有权使用归一化近场光谱法对样品进行化学纳米鉴定公开(公告)号：US09448252B2
公开(公告)日：2016-09-20
申请号：US14773135
申请日：2014-03-14
申请人： BRUKER NANO, INC.
发明人： Gregory Andreev , Sergey Osechinskiy , Stephen Minne , Chanmin Su
摘要： Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and optionally, in the mid-infrared portion of the spectrum.
摘要翻译： 用于纳米识别样品的装置和方法通过使用ev逝波测量在样品和在样品之上的纳米距离处振荡的样品和光学纳米天线之间的近场相互作用的光谱，并且鉴别背景散射辐射对这种近似不敏感 场相互作用。 通过在纳秒天线振荡的周期性重复时刻的光学数据采集可以实现歧视，而不知道距离分离纳米天线和样品。 测量包括纳米尺度上的样品的化学鉴定，其中直接测量相应于表示所述相互作用的近场辐射的相位的绝对值，而没有偏移。 仪器和测量的校准通过在样品测量之前执行具有已知折射率的参考样品的参考测量来提供。 纳米识别实现了低于50nm的分辨率，并且可选地在光谱的中红外部分中实现。
-
-
-
-
-
-
-
-
-
搜索结果
15 条记录 (耗时 0.021 秒)